A new unified visco-plastic constitutive model for the 60 Sn-40 Pb alloy used in solder joints of surface-mount IC packages and semiconductor devices is proposed. The model accounts for the measured stress-dependence of the activation energy and for the strong Bauschinger effect exhibited by the solder. The latter is represented by a back stress state variable which, in turn, evolves according to a hardening-recovery equation. Based on the observed hardening behavior, it is assumed that the isotropic resistance to plastic flow does not evolve within the deformation range covered in this study (ε< 3 percent). The deformation phenomena associated with the solder’s monotonic and steady-state cyclic responses are accurately predicted for −55°C≦T≦150°C and 8 x 10−2 s−1 ≦ ε ≦ 8 x 10−5 s−1. The model also predicts well the overall trend of steady-state creep behavior. The constitutive model is formulated within a continuum mechanics framework and is therefore well suited for implementation into finite element or other structural codes.
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July 1992
Research Papers
A Visco-Plastic Constitutive Model for 60/40 Tin-Lead Solder Used in IC Package Joints
E. P. Busso,
E. P. Busso
Mechanical Engineering Research Laboratory, Hitachi Ltd., Tsuchiura 300, Japan
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M. Kitano,
M. Kitano
Mechanical Engineering Research Laboratory, Hitachi Ltd., Tsuchiura 300, Japan
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T. Kumazawa
T. Kumazawa
Mechanical Engineering Research Laboratory, Hitachi Ltd., Tsuchiura 300, Japan
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E. P. Busso
Mechanical Engineering Research Laboratory, Hitachi Ltd., Tsuchiura 300, Japan
M. Kitano
Mechanical Engineering Research Laboratory, Hitachi Ltd., Tsuchiura 300, Japan
T. Kumazawa
Mechanical Engineering Research Laboratory, Hitachi Ltd., Tsuchiura 300, Japan
J. Eng. Mater. Technol. Jul 1992, 114(3): 331-337 (7 pages)
Published Online: July 1, 1992
Article history
Received:
June 21, 1991
Revised:
January 15, 1992
Online:
April 29, 2008
Citation
Busso, E. P., Kitano, M., and Kumazawa, T. (July 1, 1992). "A Visco-Plastic Constitutive Model for 60/40 Tin-Lead Solder Used in IC Package Joints." ASME. J. Eng. Mater. Technol. July 1992; 114(3): 331–337. https://doi.org/10.1115/1.2904181
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