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Keywords: surface morphology
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Journal Articles
Journal:
Journal of Electronic Packaging
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. March 2007, 129(1): 71–75.
Published Online: May 12, 2006
... 2005 12 05 2006 solders deformation indentation creep testing surface morphology stress relaxation finite element analysis Tin-based alloys are commonly used in microelectronics components. Thermal cycles are unavoidable and often lead to thermal fatigue damage and device...
Journal Articles
Journal:
Journal of Electronic Packaging
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. September 2006, 128(3): 246–250.
Published Online: November 29, 2005
... Zincating Deposits on the Al Pads of Si Chips ,” Thin Solid Films 0040-6090 , 288 ( 1–2 ), pp. 36 – 40 . Yau , E.-W.-C. , Gong , J.-F. , and Chan , P. , 2003 , “ Al Surface Morphology Effect on Flip-Chip Solder Bump Shear Strength ,” Microelectron. Reliab. 0026-2714 , 44 ( 2 ), pp...
Journal Articles
Journal:
Journal of Electronic Packaging
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. June 2005, 127(2): 113–119.
Published Online: June 3, 2005
... properties, including modulus reduction, Tg depression, polymer hydrolysis, and surface swelling after exposing to humidity aging. The deterioration in reliability of aged ACF joint during reflow process was mainly caused by hydroscopic swelling-induced stress of ACF. 8 Surface morphology of cured ACF...
Journal Articles
Journal:
Journal of Electronic Packaging
Publisher: ASME
Article Type: Technical Papers
J. Electron. Packag. June 2004, 126(2): 202–207.
Published Online: July 8, 2004
... 4024) and the damage mechanism of interconnect bump with BCB bumping dielectrics upon temperature cycling. Adhesion and fracture surface morphology after die shear testing show that the weakening and delamination of BCB passivation layer at the die corner is the main cause of the reduction of die...
Journal Articles
Journal:
Journal of Electronic Packaging
Publisher: ASME
Article Type: Technical Papers
J. Electron. Packag. March 2004, 126(1): 110–114.
Published Online: April 30, 2004
.... 01 March 2003 30 04 2004 silicon elemental semiconductors surface roughness surface morphology fracture toughness polishing sputter etching grinding In recent years, the rapid market growth in portable and hand-held products challenges the electronic packaging industry...