... dispersive X-ray analysis determines the composition as 69 wt. % iron (Fe), 19 wt. % chromium (Cr), 10 wt. % nickel (Ni), around 2 wt. % manganese (Mn), and less than 0.08 wt. % carbon (C), which agrees well with the data provided by the manufacturer. Diffraction peaks produced by X-ray diffraction (XRD...

... to bond SiC dice to Si 3 N 4 substrates. The dice were bonded using transient liquid phase bonding. Samples were characterized using X-ray diffraction for phase identification and Auger electron spectroscopy for depth profiling of the elemental composition of the metallization stack in the as-deposited...

...G. Y. Li; Y. C. Chan Intermetallics formation between metallization conductor Pd-Ag and solder 62Sn-36Pb-2Ag have been investigated by transmission electron microscopy (TEM) and X-Ray diffraction. Energy-dispersive X-Ray (EDX) analysis and Selected Area Electron Diffraction (SAED) analysis reveals...