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Issues
December 2018
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Review Article
Review of Thermal Packaging Technologies for Automotive Power Electronics for Traction Purposes
J. Electron. Packag. December 2018, 140(4): 040801.
doi: https://doi.org/10.1115/1.4040828
Topics:
Cooling
,
Electronics
,
Packaging
,
Temperature
,
Silicon
,
High temperature
,
Heat
Technological Advances to Maximize Solar Collector Energy Output: A Review
Swapnil S. Salvi, Vishal Bhalla, Robert A. Taylor, Vikrant Khullar, Todd P. Otanicar, Patrick E. Phelan, Himanshu Tyagi
J. Electron. Packag. December 2018, 140(4): 040802.
doi: https://doi.org/10.1115/1.4041219
Topics:
Coatings
,
Solar collectors
,
Solar energy
Research Papers
Regional Stiffness Reduction Using Lamina Emergent Torsional Joints for Flexible Printed Circuit Board Design
J. Electron. Packag. December 2018, 140(4): 041001.
doi: https://doi.org/10.1115/1.4040552
Topics:
Design
,
Hinges
,
Printed circuit boards
,
Stiffness
,
Stress
,
Deflection
,
Finite element analysis
,
Engineering prototypes
,
Materials properties
Power and Thermal Constraints-Driven Modeling and Optimization for Through Silicon Via-Based Power Distribution Network
J. Electron. Packag. December 2018, 140(4): 041002.
doi: https://doi.org/10.1115/1.4040670
Topics:
Density
,
Design
,
Heat
,
Modeling
,
Optimization
,
Silicon
,
Temperature
,
Simulation
,
Energy dissipation
,
Gates (Closures)
Reliability Analysis of Lead-Free Solders in Electronic Packaging Using a Novel Surrogate Model and Kriging Concept
J. Electron. Packag. December 2018, 140(4): 041003.
doi: https://doi.org/10.1115/1.4040924
Topics:
Failure
,
Finite element analysis
,
Modeling
,
Reliability
,
Solders
,
Thermomechanics
,
Lead-free solders
,
Electronic packaging
,
Uncertainty
,
Stress
Accelerated Vibration Reliability Testing of Electronic Assemblies Using Sine Dwell With Resonance Tracking
J. Electron. Packag. December 2018, 140(4): 041004.
doi: https://doi.org/10.1115/1.4040923
Topics:
Deflection
,
Failure
,
Failure analysis
,
Finite element analysis
,
Finite element model
,
Manufacturing
,
Reliability
,
Resonance
,
Solder joints
,
Solders
Correlation of Warpage Distribution With the Material Property Scattering for Warpage Range Prediction of PBGA Components
J. Electron. Packag. December 2018, 140(4): 041005.
doi: https://doi.org/10.1115/1.4041064
Reactive Joining of Thermally and Mechanically Sensitive Materials
Bastian Rheingans, Roman Furrer, Jürg Neuenschwander, Irina Spies, Axel Schumacher, Stephan Knappmann, Lars P. H. Jeurgens, Jolanta Janczak-Rusch
J. Electron. Packag. December 2018, 140(4): 041006.
doi: https://doi.org/10.1115/1.4040978
Topics:
Borosilicate glasses
,
Joining
,
Solders
,
Soldering
,
Tin
,
Aluminum
,
Heat
,
Temperature
,
Glass
,
Thermal shock
Assessment of Elastic–Plastic and Electrical Properties of Printed Silver-Based Interconnects for Flexible Electronics
J. Electron. Packag. December 2018, 140(4): 041007.
doi: https://doi.org/10.1115/1.4041014
Topics:
Dimensional analysis
,
Electrical properties
,
Finite element analysis
,
Flexible electronics
,
Inks
,
Modeling
,
Plasticity
,
Silver
,
Simulation
,
Stress
Error Reduction in Infrared Thermography by Multiframe Super-Resolution
J. Electron. Packag. December 2018, 140(4): 041008.
doi: https://doi.org/10.1115/1.4041360
Topics:
Emissivity
,
Errors
,
Resolution (Optics)
,
Temperature
,
Thermography
,
Uncertainty
Technical Brief
Diagonal Mode van der Pauw Stress Sensors: Proof of Diagonal-Mode Conjecture
J. Electron. Packag. December 2018, 140(4): 044501.
doi: https://doi.org/10.1115/1.4040829
Micro Copper Pillar Interconnection Using Thermosonic Flip Chip Bonding
J. Electron. Packag. December 2018, 140(4): 044502.
doi: https://doi.org/10.1115/1.4040794
Topics:
Bonding
,
Columns (Structural)
,
Flip-chip
,
Copper
,
Flip-chip devices
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Sequential Versus Concurrent Effects in Combined Stress Solder Joint Reliability
J. Electron. Packag
Anand Model Constants of Sn-Ag-Cu Solders: What Do They Actually Mean?
J. Electron. Packag