Electronic products are subjected to high G-levels during mechanical shock and vibration. Failure-modes include solder-joint failures, pad cratering, chip-cracking, copper trace fracture, and underfill fillet failures. The second-level interconnects may be experience high strain rates and accrue damage during repetitive exposure to mechanical shock. Industry migration to lead-free solders has resulted in proliferation of a wide variety of solder alloy compositions. One of the popular tin-silver-copper alloys is Sn3Ag0.5Cu. The high strain rate properties of lead-free solder alloys are scarce. Typical material tests systems are not well suited for measurement of high strain rates typical of mechanical shock. Previously, high strain rates techniques such as the split Hopkinson pressure bar (SHPB) can be used for strain rates of 1000 s−1. However, measurement of materials at strain rates of 1–100 s−1 which are typical of mechanical shock is difficult to address. In this paper, a new test-technique developed by the authors has been presented for measurement of material constitutive behavior. The instrument enables attaining strain rates in the neighborhood of 1–100 s−1. High-speed cameras operating at 300,000 fps have been used in conjunction with digital image correlation (DIC) for the measurement of full-field strain during the test. Constancy of crosshead velocity has been demonstrated during the test from the unloaded state to the specimen failure. Solder alloy constitutive behavior has been measured for SAC305 solder. Constitutive model has been fit to the material data. Samples have been tested at various time under thermal aging at 25 °C and 125 °C. The constitutive model has been embedded into an explicit finite element framework for the purpose of life-prediction of lead-free interconnects. Test assemblies has been fabricated and tested under Joint Electron Device Engineering Council (JEDEC) JESD22-B111 specified condition for mechanical shock. Model predictions have been correlated with experimental data.
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March 2015
Research-Article
Stress–Strain Behavior of SAC305 at High Strain Rates
Pradeep Lall,
Pradeep Lall
Department of Mechanical Engineering,
NSF-CAVE3 Electronics Research Center,
e-mail: lall@auburn.edu
NSF-CAVE3 Electronics Research Center,
Auburn University
,Auburn, AL 36849
e-mail: lall@auburn.edu
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Sandeep Shantaram,
Sandeep Shantaram
Department of Mechanical Engineering,
NSF-CAVE3 Electronics Research Center,
NSF-CAVE3 Electronics Research Center,
Auburn University
,Auburn, AL 36849
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Jeff Suhling,
Jeff Suhling
Department of Mechanical Engineering,
NSF-CAVE3 Electronics Research Center,
NSF-CAVE3 Electronics Research Center,
Auburn University
,Auburn, AL 36849
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David Locker
David Locker
U.S. AMRDEC
,Redstone Arsenal
,Huntsville, AL 35802
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Pradeep Lall
Department of Mechanical Engineering,
NSF-CAVE3 Electronics Research Center,
e-mail: lall@auburn.edu
NSF-CAVE3 Electronics Research Center,
Auburn University
,Auburn, AL 36849
e-mail: lall@auburn.edu
Sandeep Shantaram
Department of Mechanical Engineering,
NSF-CAVE3 Electronics Research Center,
NSF-CAVE3 Electronics Research Center,
Auburn University
,Auburn, AL 36849
Jeff Suhling
Department of Mechanical Engineering,
NSF-CAVE3 Electronics Research Center,
NSF-CAVE3 Electronics Research Center,
Auburn University
,Auburn, AL 36849
David Locker
U.S. AMRDEC
,Redstone Arsenal
,Huntsville, AL 35802
Contributed by the Electronic and Photonic Packaging Division of ASME for publication in the JOURNAL OF ELECTRONIC PACKAGING. Manuscript received January 1, 2014; final manuscript received September 19, 2014; published online November 14, 2014. Assoc. Editor: Yi-Shao Lai.
J. Electron. Packag. Mar 2015, 137(1): 011010 (16 pages)
Published Online: March 1, 2015
Article history
Received:
January 1, 2014
Revision Received:
September 19, 2014
Online:
November 14, 2014
Citation
Lall, P., Shantaram, S., Suhling, J., and Locker, D. (March 1, 2015). "Stress–Strain Behavior of SAC305 at High Strain Rates." ASME. J. Electron. Packag. March 2015; 137(1): 011010. https://doi.org/10.1115/1.4028641
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