Electron backscatter diffraction (EBSD) is used to investigate crystal lattice rotation caused by plastic deformation during high-strain rate laser shock peening in single crystal aluminum and copper sample on 110¯ and (001) surfaces. New experimental methodologies are employed which enable measurement of the in-plane lattice rotation under approximate plane-strain conditions. Crystal lattice rotation on and below the microscale laser shock peened sample surface was measured and compared with the simulation result obtained from FEM analysis, which account for single crystal plasticity. The lattice rotation measurements directly complement measurements of residual strain/stress with X-ray micro-diffraction using synchrotron light source and it also gives an indication of the extent of the plastic deformation induced by the microscale laser shock peening.

Issue Section:
Technical Papers
Keywords:
plastic deformation, shot peening, electron backscattering, electron diffraction, shock wave effects, laser materials processing, aluminium, copper, finite element analysis, plasticity, internal stresses, X-ray diffraction, crystal orientation, stress measurement
Topics:
Crystals, Deformation, Electron backscatter diffraction, Laser hardening, Microscale devices, Plasticity, Rotation, Shock (Mechanics), Shot peening, Stress, Simulation, X-ray diffraction, Lasers, Aluminum, Finite element methods, Finite element model, Copper
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