Technical Briefs

A Simply Analytic Study of Buckled Thin Films on Compliant Substrates

[+] Author and Article Information
Huanyu Cheng

Departments of Mechanical Engineering and
Civil and Environmental Engineering,
Center for Engineering and Health, and
Skin Disease Research Center,
Northwestern University,
Evanston, IL 60208

Jizhou Song

Department of Mechanical and Aerospace Engineering,
University of Miami,
Coral Gables, FL 33146
e-mail: jsong8@miami.edu

1Corresponding author.

Manuscript received August 19, 2013; final manuscript received August 21, 2013; accepted manuscript posted August 28, 2013; published online October 29, 2013. Editor: Yonggang Huang.

J. Appl. Mech 81(2), 024501 (Oct 29, 2013) (3 pages) Paper No: JAM-13-1349; doi: 10.1115/1.4025306 History: Received August 19, 2013; Revised August 21, 2013; Accepted August 28, 2013

Buckling of stiff thin films on compliant substrates enables many new applications, such as stretchable electronics. Song et al. [2008, “Buckling of a Stiff Thin Film on a Compliant Substrate in Large Deformation,” Int. J. Solids Struct., 45(10), pp. 3107–3121] developed a finite deformation theory to explain the buckled amplitude and wavelength very well. This theory not only accounts for finite geometry change, but also the finite strain and a nonlinear constitutive model for the substrate. To provide a better physical insight, this paper investigates those three effects, and shows that finite geometry change dominates in the finite deformation theory and the simplified analysis leads to results that agree well with experiments and the finite element method.

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Grahic Jump Location
Fig. 3

Wavelength and amplitude as a function of applied strain with a prestrain of 16.2%

Grahic Jump Location
Fig. 2

Wavelength and amplitude as a function of prestrain

Grahic Jump Location
Fig. 1

Schematic illustration of the process for fabricating buckled thin films on compliant substrates with (a)-(b) prestrain strategy and (c) postbuckling upon applied strain




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