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TECHNICAL PAPERS

Mode II Edge Delamination of Compressed Thin Films

[+] Author and Article Information
D. S. Balint, J. W. Hutchinson

Division of Engineering and Applied Sciences, Harvard University, Cambridge, MA 02138

J. Appl. Mech 68(5), 725-730 (Mar 03, 2001) (6 pages) doi:10.1115/1.1388012 History: Received September 07, 2000; Revised March 03, 2001
Copyright © 2001 by ASME
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References

Figures

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A schematic showing an edge delamination and a buckle delamination and the minimum flaw sizes necessary to achieve steady-state
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A schematic of the superposition scheme
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The coupling of normal and tangential displacements caused by surface roughness
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A plot of the displacement coupling relationship
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Normalized mode II stress intensity factor
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Normalized energy release rate
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Normal stress at the interface for μf=1.0 and σ̄=5.0
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Normalized apparent mode II fracture toughness for R̄=0.5

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