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TECHNICAL PAPERS

Characterization of Plastic Deformation Induced by Microscale Laser Shock Peening

[+] Author and Article Information
Hongqiang Chen, Jeffrey W. Kysar, Y. Lawrence Yao

Department of Mechanical Engineering, Columbia University, New York, NY 10027

J. Appl. Mech 71(5), 713-723 (Nov 09, 2004) (11 pages) doi:10.1115/1.1782914 History: Received September 04, 2003; Revised April 29, 2004; Online November 09, 2004
Copyright © 2004 by ASME
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References

Johnson,  K. L., 1968, “Deformation of A Plastic Wedge by a Rigid Flat Die Under the Action of a Tangential force,” J. Mech. Phys. Solids, 16, pp. 395–402.
Clauer, A. H., and Holbrook, J. H., 1981, “Effects of Laser Induced Shock Waves on Metals,” Shock Waves and High Strain Phenomena in Metals-Concepts and Applications, Plenum, New York, pp. 675–702.
Zhang, W., and Yao, Y. L., 2000, “Improvement of Laser Induced Residual Stress Distributions via Shock Waves,” Proc. ICALEO’00, Laser Materials Processing, Laser Institute of America, Orlando, FL, 89 , pp. E183–192.
Zhang,  W., and Yao,  Y. L., 2000, “Microscale Laser Shock Processing of Metallic Components,” ASME J. Manuf. Sci. Eng., 124(2), pp. 369–378.
Chen, H. Q., and Yao, Y. L., 2003, “Modeling Schemes, Transiency, and Strain Measurement for Microscale Laser Shock Processing,” ASME J. Manuf. Sci. Eng., submitted for publication.
Chen, H. Q., Yao, Y. L., and Kysar, J. W., 2003, “Spatially Resolved Characterization of Residual Stress Induced by Microscale Laser Shock Peening,” ASME J. Manuf. Sci. Eng., to appear.
Zhang, W., and Yao, Y. L., 2001, “Feasibility Study of Inducing Desirable Residual Stress Distribution in Laser Micromachining,” Transactions of the North American Manufacturing Research Institution of SME (NAMRC XXIX) 2001, Society of the Manufacturing Engineers, Dearborn, MI, pp. 413–420.
Rice,  J. R., 1987, “Tensile Crack Tip Fields in Elastic-Ideally Plastic Crystals,” Mech. Mater., 6, pp. 317–315.
Kysar,  J. W., and Briant,  C. L., 2002, “Crack Tip Deformation Fields in Ductile Single Crystals,” Acta Mater., 50, pp. 2367–2380.
Randle, V., 1992, Microtexture Determination and its Applications, The Institute of Materials, London.
HKL Channel 5™ User’s Manual, 2001, HKL Technology, Danbury, CT.
Kocks, U. F., 1998, Texture and Anisotropy, Cambridge University Press, Cambridge, pp. 44–100.
Cullity, B. D., 1978, Elements of X-ray Diffraction, 2nd Ed., Addison-Wesley, London, pp. 13–20.
Hill,  R., 1966, “Generalized Constitutive Relations For Incremental Deformation of Metals By Multislip,” J. Mech. Phys. Solids, 14, pp. 95–102.
Rice, R. J., 1977, “The Localization of Plastic Deformation,” Proceedings of 14th International Congress of Theoretical and Applied Mechanics, I ., North-Holland, Amsterdam.
Asaro,  R. J., 1983, “Micromechanics of Crystals and Polycrystals,” Adv. Appl. Mech., 23, pp. 1–115.
Huang, Y., 1991, “A User-Material Subroutine Incorporating Single Crystal Plasticity in the ABAQUS Finite Element Program, Mech Report 178,” Division of Applied Sciences, Harvard University, Cambridge, MA.
Kysar, J. W., 1997. Addendum to “A User-Material Subroutine Incorporating Single Crystal Plasticity in the ABAQUS Finite Element Program, Mech Report 178,” Division of Engineering and Applied Sciences, Harvard University, Cambridge, MA.
ABAQUS/Standard User’s Manual, 2002. Version 6.2, Hibbit, Karlsson and Sorensen, Inc., Pawtucket, RI.

Figures

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Laser shock peening setup
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Sample geometry and laser shock peening condition; (a) Al(11̄0) sample and Cu(11̄0) sample, (b) Al (001) sample
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Measurement of shocked line geometry using AFM for Al(11̄0) sample (scan area=100×100 μm); (a) three-dimensional geometry, (b) cross section geometry at different positions (line spacing=20 μm)
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EBSD automatic indexing map on top surface and on newly exposed cross section
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Inverse pole figure of sample surface under shock peening (Z-direction is shock direction, Y-direction is the sample surface normal)
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Lattice rotation contour map on sample surface (line 1–4: four cross section with spacing=20 μm); (a) and (b): Al(11̄0) sample; (c) and (d): Cu(11̄0) sample; (e) and (f ): Al (001) sample
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Lattice rotation contour at the cross section (a) Al(11̄0) sample; (b) Cu(11̄0) sample
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Scan scheme of X-ray microdiffraction
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(a) In-plane lattice rotation on shock peened surface of Al(11̄0) sample. (b) Out-of-plane lattice rotation on shock peened surface of Al(11̄0) sample. (c) In-plane lattice rotation on shock peened surface of Cu(11̄0) sample. (d) Out-of-plane lattice rotation on shock peened surface of Cu(11̄0) sample.
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Plastic deformation in single crystal plasticity
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Lattice rotation field on cross section of after laser shock peening; (a) Al(11̄0), (b) Cu(11̄0), (c) Al (001)
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Spatially distribution of latticed rotation on sample surface from simulation
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Deformation profile in depth direction from simulation and AFM; (a) FEM result, (b) AFM result
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Three plane-strain slip systems and yield surface in (110) plane; (a) Al(11̄0) and Cu(11̄0) sample, (b) Al (001) sample, (c) yield surface in (110) plane
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Shear strain on active slips under laser shock peening from simulation; (a) shear strain of active slip systems for Al(11̄0) sample, (b) shear strain of active slip systems for Cu(11̄0) sample, (c) shear strain of active slip systems for Al (001) sample

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