A General Solution for Two-Dimensional Stress Distributions in Thin Films

[+] Author and Article Information
R. Krishnamurthy, D. J. Srolovitz

Princeton Institute for the Science and Technology of Materials, and Department of Mechanical and Aerospace Engineering, Princeton University, Princeton, NJ 08540

J. Appl. Mech 71(5), 691-696 (Nov 09, 2004) (6 pages) doi:10.1115/1.1782649 History: Received August 26, 2003; Revised April 22, 2004; Online November 09, 2004
Copyright © 2004 by ASME
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Grahic Jump Location
A schematic illustration of a thin film on a thick rigid substrate. The coordinate axes in film thickness H are labeled.
Grahic Jump Location
A schematic illustration of the steps involved in the Eshelby procedure
Grahic Jump Location
Exact and calculated results for a stress-free strain that is sinusoidally modulated in x are shown at z=0.005
Grahic Jump Location
Exact and calculated results for the in-plane stress for a stress-free strain that is a function of z alone, i.e., εm=(z/H)3−z/H
Grahic Jump Location
Stresses due to a thermally mismatched inclusion; (a) shows contours of constant σxx in the film for a rectangular inclusion embedded in the center of the film and (b) is a comparison of the stresses obtained using Hu’s formulas and those obtained from our calculations for z=0.025




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