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BRIEF NOTES

A Combined Fourier Series–Galerkin Method for the Analysis of Functionally Graded Beams

[+] Author and Article Information
H. Zhu, B. V. Sankar

Department of Mechanical and Aerospace Engineering, University of Florida, Gainesville, FL 32611-6250

J. Appl. Mech 71(3), 421-424 (Jun 22, 2004) (4 pages) doi:10.1115/1.1751184 History: Received July 01, 2002; Revised December 05, 2003; Online June 22, 2004
Copyright © 2004 by ASME
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References

Figures

Grahic Jump Location
A FGM beam subjected to symmetric transverse loading
Grahic Jump Location
Normalized axial stress σxx through the thickness of FGM beam for Eh=10 E0. The exact solution and that of Galerkin method are indistinguishable.
Grahic Jump Location
Normalized axial stress σxx through the thickness of FGM beam for Eh=0.1 E0. The exact solution and that of Galerkin method are indistinguishable.
Grahic Jump Location
Transverse shear stress through the thickness of FGM beam for Eh=10 E0. The exact solution and that of Galerkin method are indistinguishable.
Grahic Jump Location
Transverse shear stress through the thickness of FGM beam for Eh=0.1 E0. The exact solution and that of Galerkin method are indistinguishable.

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