Elastic Force on a Point Defect in or Near a Surface Layer

[+] Author and Article Information
H. Yua, S. C. Sanday

Naval Research Laboratory, Washington, DC 20375343

D. J. Bacon

University of Liverpool, Liverpool, U.K.

J. Appl. Mech 63(4), 1042-1045 (Dec 01, 1996) (4 pages) doi:10.1115/1.2787228 History: Received January 04, 1995; Revised March 01, 1996; Online October 26, 2007


The elastic force on a point defect within or near a surface layer is determined by the image method. There is no stable equilibrium position for the point defect in the surface layer, it is attracted either to the free surface or to the interface. When the point defect is in the substrate it is attracted to the interface when the surface layer is softer than the substrate and to an equilibrium position in the substrate when the surface layer is stiffer than the substrate, the equilibrium position being a function of the elastic constants and the layer thickness.

Copyright © 1996 by The American Society of Mechanical Engineers
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